Product

The newest model in Shimadzu’s EDX series, the EDX-GP offers fast, high-sensitivity measurements of all light-to-heavy elements. And, with a number of automated functions and simple, easy-to-follow operating procedures, X-ray analysis has never been easier, even for beginners.

Features

Full Automation
A single click in the [Screening Analysis] window automatically performs everything from measurement to the display of results, in accordance with your pre-registered analysis conditions.

Industry-leading Detection Sensitivity and Resolution
Shimadzu’s proprietary semiconductor detector ensures high-sensitivity, high-resolution, and high-precision measurement of everything from light to heavy elements.

Special Filters
Five types of standard filters improve detection sensitivity by reducing and eliminating scattered X-ray tube radiation that creates background components. Flexible filter conditions, such as when needing sensitive measurements of trace samples, are available to suit customer needs.

Large Sample Chamber
In contrast to its compact size, the EDX-GP has a large sample chamber to accommodate as-is measurements of any sample shape or size. Users can load samples quickly and easily with a semiautomatic chamber door for high throughput with less workload.

Sample Observation Function
When measuring foreign substances and samples with multiple parts, the sample observation camera allows analysis position to be easily specified by checking the camera image.

RoHS/ELV Applications
EDX-GP standard equipment includes all the functions required for RoHS/ELV analysis.

Software

With the EDX-GP, operations that previously relied on a user’s judgment are now automated, including instrument start-up and calibration, and the selection of analytical conditions. Simple procedures ensure worry-free operation, even for first-time users. Other software features include:

• Measurement Time Reduction Function – Even if measurements are in progress, if a pass/fail judgment becomes possible, measurements are automatically completed to save analysis time.
• Shape Correction Function – The EDX-GP utilizes a BG internal standard method to eliminate the effect of shape and thickness in order to provide highly precise results
• Automatic Selection of Analytical Conditions
• Automatic Calibration Curve Selection Function
• Calibration Curve Method
• FP Method
• Thin Film Analysis Method

EDX Configurator

Specifications