Electronics/Semiconductors Materials Testing
Testing, Analysis and Inspection of Electronics and Semiconductors
Shimadzu provides a range of analytical instruments to assist in the development and production of advanced electronics and semiconductor materials. Shimadzu SMX 225CT non-destructive x-ray tomography system, EPMA 8050G Electron Microprobe and SPM 8700 Scanning Probe Microscope are used world-wide to image the electronic materials that are critical to consumer electronics, transportation and communications industries.
Solutions for Electronics & Chemicals
Both inorganic and organic analyses are indispensable for electronics industry and related chemical industries. Purposes for analysis are wide ranging, and data generated can give much insight for research/development, reduction of defects, conforming to regulations and increasing productivity, all of which will contribute to delivering better products to consumers with diminished impact on our environment. This application handbook is a compilation of case studies where analytical techniques are playing critical roles in various parts of electronic industries. It demonstrates the range of analytical solutions provided by Shimadzu, from simple evaluation test to combinatorial use of inorganic and organic analytical methods. We are hoping that you will find the solution that addresses your needs.
Journals & Papers
Device for Streptavidin Detection Using LSPR and Electrochemical Transductions on the same Platform
J. Braz. Chem. Soc., Vol. 32, No. 4, 777-785, 2021 Printed in Brazil - ©2021 Sociedade Brasileira de Química
Simple and Reliable Fabrication Method for Polydimethylsiloxane Dielectric Elastomer Actuators Using Carbon Nanotube Powder Electrodes
Ardi Wiranata, Yasuyuki Ishii, Naoki Hosoya, Shingo Maeda Adv. Eng. Mater. 2021, 2001181
Influence of bonded area size on cracking in reacted NiAl layer for crack-free reactive soldering
Kana Maekawa et al 2020 Jpn. J. Appl. Phys. 59 SIIL01