With the recent growing interest in the safety of many products, including foods, pharmaceuticals, electronic goods, and cars, there is an increasing demand for contaminant analysis. When performing contaminant analysis work, measured positions and aperture sizes (measured area size) can vary between analysts, which introduces variations or errors in the results. Shimadzu's automatic failure analysis system (IRTracer-100 infrared spectrophotometer and AIM-9000 infrared microscope) comes with an automatic contaminant recognition system as standard, which automatically recognizes contaminants and
automatically sets the optimum aperture size and angle in just one second. We describe an example analysis performed using the automatic contaminant recognition system.