SMX-1000 Plus and SMX-1000L Plus Real-Time 2D X-Ray Inspection Systems
Thorough Internal Examination of Electronic Components and Small Parts
Quick and Easy Operation
Easy sample loading and positioning means x-ray images of points of interest are generated quickly.
Step Feed and Teaching functions help increase productivity by scanning parts automatically with pre-registered patterns. The Step Feed function takes images of the entire sample at constant intervals whereas the Teaching function takes images at pre-registered points of interest.
Large Sample Option
The SMX-1000L Plus can handle large samples with sizes up to 570 x 670 mm. In contrast, the SMX-1000 Plus can accept samples with sizes up to 350 x 400 mm.
For initial inspection, the panoramic imaging function allows the user to image a whole sample that cannot be viewed in a single frame.
High-Quality Images for Precise Analysis
Distortion- and shading-free images provide accurate analysis and measurement.
Tilt and Computed Tomography for More Detailed Analysis
When the detector and the sample are parallel to each other, depth information cannot be obtained, meaning some defects are missed. The SMX-1000(L) Plus can tilt the detector up to 60 degrees while maintaining constant magnification and tracking observation points.
For more detailed analysis, an optional computed tomography unit is available.
Image Metric Functions and Optional Automatic Measurement Modules
Various image metric functions allow for easy parameter setting and fast calculation. The pixel length is automatically converted into actual distances based on magnification. Data can be exported into a CSV file.
Optional automatic image measurement modules for BGA void, area ratio, and Lithium-ion battery measurements are available. Synchronization with the Teaching and Step Feed functions allows users to acquire inspection results in real time.