SPM-Nanoa Scanning Probe / Atomic Force Microscope

Answering the Need for Fast Physical Property Mapping! Fast and High-Resolution Visualization of Mechanical Properties

Answering the Need for Fast Physical Property Mapping! Fast and High-Resolution Visualization of Mechanical Properties

Remarkable advances have been achieved in the functional properties of polymeric materials in recent years, and technologies that enable quantitative evaluation of the nanostructure and elastic modulus of those materials are now required. Although the scanning probemicroscope (SPM(AFM)) is used in those evaluations, fast physical property mapping by Shimadzu SPM-Nanoa has realized high-speed measurement of mechanical properties. This article introduces an example of fast and high-resolution visualization of the distributions of the elastic modulus and adhesion of polyethylene (PE) by fast physical property mapping using a SPM-Nanoa and Shimadzu nano physical property evaluation software “Nano 3D Mapping™ Fast.”

Read More 

 

8K High Pixel Resolution Observation Leading You into the Nano World! Simultaneously Achieves Both Large-Area Observation and High Definition Analysis

8K High Pixel Resolution Observation Leading You into the Nano World! Simultaneously Achieves Both Large-Area Observation and High Definition Analysis

This article introduces an example in which both large-area observation and high definition analysis were achieved simultaneously by using the SPM-Nanoa, a new Shimadzu SPM that realizes 8K high pixel resolution observation.

Read More 

 

Visualization of Piezoelectric Response in Extremely Small Region of Piezoelectric Material by SPM

Visualization of Piezoelectric Response in Extremely Small Region of Piezoelectric Material by SPM

Piezoelectric materials are composed of aligned spontaneous polarization regions (domains). These domains are polarized in different directions, as shown in Fig. 1 and display different responses to applied voltage. The response of the individual domains is a key factor that determines the characteristics of a piezoelectric material. However, high sensitivity is required in order to evaluate the domain response because deformation on the nanometer order under an applied voltage is not uncommon. Here, we introduce an example in which the minute response of a piezoelectricmaterial to an applied voltagewas captured by using a scanning probe microscope (SPM (AFM)), which is capable of detecting the piezoelectric response at the sub-nanometer order.

Read More 

For Research Use Only. Not for use in diagnostic procedures.

Top of This Page