FLM-UVPC Film Thickness Measurement Software

Diffuse Reflectance Measurement
 

This software calculates film thickness from the peak positions of the interference pattern caused by the film. Film thickness is calculated by the method of least square using the wavelengths of the all peaks and valleys within a specified wavelength range.

 
  • For UV-2450/2550/2600/2700/3600/SolidSpec
  • PC software (compatible OS: Windows XP/VISTA/7)

For Research Use Only. Not for use in diagnostic procedures.

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