UV/Vis/NIR Spectroscopy in the Arena of Materials Characterization Research and Quality Control: How Instrumental Performance and Accessories Define Success
Title: UV/Vis/NIR Spectroscopy in the Arena of Materials Characterization Research and Quality Control: How Instrumental Performance and Accessories Define Success
Duration: 1 hour
Available On Demand
Most people think solutions in a cuvette when referring to spectrophotometers; however, in the world of materials characterization, rarely are solutions the primary sample. Here the samples can be anything from solid, creams, gels, particle suspensions, films, and in some cases actual human beings (sunscreen characterization). These samples all have one thing in common, they are impossible to dilute. The materials characterization high performance spectrophotometer must have the ability to measure high absorbance values (8 to 10 absorbance units). Instrumental parameters that are crucial to measuring materials characterization samples are stray light, noise, resolution, and scan speed. In this presentation we will address how these inter-related parameters influence measurement success.
Most measurements for the above-mentioned samples are not of the simple transmission type. Reflection, both specular and diffuse, and scatter transmission measurements abound in the world of materials characterization. It is vital that the proper accessory be employed to match the measurement desired. This presentation will address the function of integrating spheres and how they can be used to measure both diffuse reflection and transmission. Also discussed will be the difference between a relative and absolute reflection measurement. Finally, an overview will be given of important accessories related to the materials characterization marketplace.