XRF Spectrometry and X-ray Diffractometry Instruments

Energy Dispersive X-ray fluorescence (EDXRF) spectrometry is used to perform qualitative and quantitative analysis of samples by measuring re-emitted characteristic X-rays from elements. The ideal tool for non-destructive applications, energy dispersive XRF spectrometers allow measurement of a wide variety of sample types, such as solids, powders, and thin films, in many different applications areas, including electronics, chemicals, pharmaceuticals, and foods.

With X-ray Diffraction (XRD), samples are excited with x-rays at changing angles, and the emitted X-rays are detected as a function of angle. XRD measurements provide routine identification and quantification of crystal phases in powder and polycrystalline samples. Percent crystallinity, residual stress, crystallite size, lattice strain and thin film measurements are also possible.

X-ray Product Lineup

EDX-7000/8000/8100 Energy Dispersive X-ray Fluorescence Spectrometer for XRF spectrometry

EDX-7000/8000/8100 Energy Dispersive X-ray Fluorescence (EDXRF) Spectrometer

Incorporating a state-of-the-art semiconductor detector and a high fluorescent X-ray count per unit time, the EDX-7000/8000/8100 EDXRF spectrometers achieve fast, precise, high-resolution elemental analysis of various samples.
EDX-LE for XRF spectrometry RoHS/ELV Screening

EDX-LE for RoHS/ELV Screening

EDX-LE is an X-ray fluorescence spectrometer designed specifically for screening elements regulated by the RoHS/ELV directives.
XRF-1800 Sequential WDXRF X-ray Fluorescence Spectrometer

XRF-1800 Sequential WDXRF

Featuring local analysis and 250 mm mapping capabilities as standard features, plus outstanding basic functionality, the sequential XRF-1800 spectrometer delivers reliable analysis of a wide range of samples.
XRD-6100/7000 X-ray Diffractometers

XRD-6100/7000 X-ray Diffractometers

With their ease of use and abundant functions, the XRD-6100/7000 X-ray diffractometers offer solutions encompassing wide-ranging analysis requirements, from routine qualitative and quantitative analysis to state change analysis.
OneSight Wide-Range High-Speed Detector

OneSight Wide-Range High-Speed Detector

One-dimensional high-speed detector for X-Ray diffractometers, in conjunction with a state-of-the-art user interface, achieves high-sensitivity analysis and high-speed measurement.

Contaminant Finder / EDXFTIR Analysis Software

Software package designed to optimize identification of real-world contaminants using data acquired by an energy dispersive X-ray fluorescence (EDXRF) spectrometer and a Fourier transform infrared (FTIR) spectrophotometer.

For Research Use Only. Not for use in diagnostic procedures.

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