Imaging is the visualization of spatial differences in the distribution or chemical structure of substances within an object for measurement. Since the technique can obtain a lot of information within a short time period, it is widely utilized for various purposes such as contaminant analysis and the analysis of industrial materials and biological samples. The AIM-9000 infrared microscope features a mapping speed approximately four times faster*1 than the preceding AIM-8800, therefore enabling unprecedentedly speedy and streamlined imaging analysis. In addition, the AIM-9000 also features outstandingly high sensitivity with an S/N ratio of 30,000:1, which is the highest in the industry. As such, the AIM-9000 achieves both high speed and high sensitivity. The mapping program is capable of both area mapping measurement for analyzing the in-plane distribution of substances within a sample, and line mapping measurement which is effective for analysis in the depth direction. This article introduces example analyses regarding a mixed contaminant and a defect on an electronic substrate.