Imaging with the AIM-9000 Infrared Microscope - Defect Analysis in the Electrical and Electronic Fields

Imaging is the visualization of spatial differences in the distribution or chemical structure of substances within an object for measurement. Since the technique can obtain a lot of information within a short time period, it is widely utilized for various purposes such as contaminant analysis and the analysis of industrial materials and biological samples. The AIM-9000 infrared microscope features a mapping speed approximately four times faster*1 than the preceding AIM-8800, therefore enabling unprecedentedly speedy and streamlined imaging analysis. In addition, the AIM-9000 also features outstandingly high sensitivity with an S/N ratio of 30,000:1, which is the highest in the industry. As such, the AIM-9000 achieves both high speed and high sensitivity. The mapping program is capable of both area mapping measurement for analyzing the in-plane distribution of substances within a sample, and line mapping measurement which is effective for analysis in the depth direction. This article introduces example analyses regarding a mixed contaminant and a defect on an electronic substrate.

Content Type:
Application News
Document Number:
A559
Product Type:
Molecular Spectroscopy, FTIR Spectrophotometers
Keywords:
Mapping, Contaminant, mapping analysis, automatic, electronic, imaging, color map, microscope , Energy and Chemicals, AIM-9000
File Name:
A559.pdf
File Size:
655kb

View Article

For Research Use Only. Not for use in diagnostic procedures.

Top of This Page