Variable Angle Absolute Reflectance System for SolidSpect-3700

This Application News introduces the measurement results of the absolute reflectance of a silicon wafer’s mirror-polished surface at various incident angles using the SolidSpec-3700 UV-VIS-IR spectrophotometer with an installed variable angle absolute reflectance attachment.

Content Type:
Application Note
Document Number:
LAAN-A-UV-E011
Product Type:
Molecular Spectroscopy, UV-Vis Spectrophotometers
Keywords:
absolute reflectance, silicon, wafer,reflectance, solidspec-3700, uv-vis
Language:
English
File Name:
A394.pdf
File Size:
422kb

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For Research Use Only. Not for use in diagnostic procedures.

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