New One-Dimensional Fast Detector for X-Ray Diffractometers Achieves High-Sensitivity Analysis and High-Speed Measurement
Shimadzu Scientific Instruments has released the OneSight high-speed detector for use with its XRD-6100/7000 X-ray diffractometers. The OneSight achieves high-sensitivity analysis, more than 100 times higher than scintillation detectors.
The silicon detector features 1,280 channels, which enables a wide range of diffraction angles to be measured at once for higher throughput. By using specified diffraction peaks, the OneSight is also useful for quantitative and stress analysis. In addition, the detector features a ONE SHOT function that allows a simultaneous diffraction profile measurement at a more than 10 deg. angle range without a scanning goniometer.
With the OneSight, quantitative analysis is performed with one of three measurement modes: high-resolution, standard and fast. Compared to scintillation detectors, the OneSight can perform high-speed measurement 10 times faster in high-resolution mode, 15 times faster in standard mode, and 25 times faster in fast mode.
The OneSight’s state-of-the-art user interface and measurement software enhance operational efficiency for users. The software features a loading and editing window for analysis condition files, machine status and analytical progress displays, as well as an analysis condition registration window. Users can customize the arrangement of the display on screen for easier analysis.
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