Energy Dispersive X-ray Fluorescence Spectrometer

EDX-7200 Energy Dispersive X-ray Fluorescence Spectrometer

The EDX-7200 is a flagship model of the EDX series in pursuit of high sensitivity, high speed and high precision. This model supports new regulations and directives for consumer and environmental compliance, such as RoHS/ELV, REACH, and TSCA with full exclusive screening analysis kits.

EDX-7200 offers superior energy resolution compared to previous models by incorporating a state-of-the-art SDD detector. This reduces the effects of overlapping peaks of different elements, enhancing the reliability of the analysis results.



Supports Various Applications in Many Fields

  • ■Electrical/electronic materials

    • RoHS and halogen screening
    • Thin-film analysis for semiconductors, discs, liquid crystals, and solar cells


    ■Automobiles and machinery

    • ELV hazardous element screening
    • Composition analysis, plating thickness measurement, and chemical conversion coating film weight measurement for machine parts


    ■Ferrous/non-ferrous metals

    • Main component analysis and impurity analysis of raw materials, alloys, solder, and precious metals
    • Composition analysis of slag



    • Grade analysis for mineral processing



    • Analysis of ceramics, cement, glass, bricks, and clay


    ■Oil and petrochemicals

    • Analysis of sulfur in oil
    • Analysis of additive elements and mixed elements in lubricating oil


  • ■Chemicals

    • Analysis of products and organic/inorganic raw materials
    • Analysis of catalysts, pigments, paints, rubber, and plastics



    • Analysis of soil, effluent, combustion ash, filters, and fine particulate matter



    • Analysis of residual catalyst during synthesis
    • Analysis of impurities and foreign matter in active pharmaceutical ingredients


    ■Agriculture and foods

    • Analysis of soil, fertilizer, and plants
    • Analysis of raw ingredients, control of added elements, and analysis of foreign matter in foods



    • Composition analysis of archeological samples and precious stones, analysis of toxic heavy metals in toys and everyday goods


Principle of Fluorescent X-ray Generation

Electron Paths and Principle of X-ray Generation Expressed as a Bohr Model

Electron Paths and Principle of X-ray Generation Expressed as a Bohr Model

When a sample is irradiated with X-rays from an X-ray tube, the atoms in the sample generate unique X-rays that are emitted from the sample. Such X-rays are known as "fluorescent X-rays" and they have a unique wavelength and energy that is characteristic of each element that generates them. Consequently, qualitative analysis can be performed by investigating the wavelengths of the X-rays. As the fluorescent X-ray intensity is a function of the concentration, quantitative analysis is also possible by measuring the amount of X-rays at the wavelength specific to each element.


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