Surface Analysis

Shimadzu offers a range of instruments that are ideal for all sample forms handled by customers in the fields of steel, non-ferrous metals, environment, foods, chemicals, pharmaceuticals, semiconductors, ceramics, and polymers.

EPMA/SEM offers analysis of targets from several centimeters to several microns; XPS offers analysis from several millimeters to several microns; and SPM permits observations from over a hundred microns to several nanometers.

Product Lineup

EPMA-8050G Electron Probe Microanalyzer

EPMA-8050G Electron Probe Microanalyzer

This instrument is equipped with a cutting-edge FE electron optical system, which provides unprecedented spatial resolution under all beam current conditions, from SEM observation conditions up to 1 μA order. Integration with high performance X-ray spectrometers that Shimadzu has fostered through the company's traditions achieves the ultimate advance in analysis performance.
SPM-Nanoa Scanning Probe / Atomic Force Microscope

SPM-Nanoa Scanning Probe / Atomic Force Microscope

SPM-Nanoa microscopes include an advanced high-sensitivity detection system and automatic viewing functionality as standard features.

For Research Use Only. Not for use in diagnostic procedures.

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