Revolutionize Surface Analysis with SPM-9700HT: Uncover Nano Secrets - Specs
Scanning Probe Microscope/Atomic Force Microscope
Specs
| Resolution | XY | 0.2 nm |
|---|---|---|
| Z | 0.01 nm | |
| Max scanning size （X・Y・Z） |
10 µm×10 µm×1 µm (standard) 30 µm×30 µm×5 µm (optional) 125 µm×125 µm×7 µm (optional) 55 µm×55 µm×13 µm (optional) 2.5 µm×2.5 µm×0.3 µm (optional) |
|
| Max sample size | φ24 mm×8 mm | |
Installation Specifications
| Temperature | 23℃±5℃ |
|---|---|
| Humidity | 60 % max. (no condensation) |
| Single Phase | 100 to 120 V, 50/60 Hz, 15 A, 2 circuits |
| Grounding | Type D grounding (maximum resistance 100 Ω) |
| SPM Unit | W180 × D255 × H260 mm, 5.5 kg |
| Control Unit | W250 × D420 × H454 mm, 18.5 kg |
- This figure is one example of a configuration.
- The sizes of the OA table and desk-type air-spring
vibration damper are for reference.