Revolutionize Surface Analysis with SPM-Nanoa: Uncover Nano Wonders!

Scanning Probe Microscope/Atomic Force Microscope

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High-Resolution Scanning Probe Microscope | SPM-Nanoa

SPM-Nanoa microscopes come equipped with a high-sensitivity detection system and automated viewing capabilities as standard features. This enables faster, easier, and more detailed observation of your target areas. As a result, SPM-Nanoa microscopes offer robust support for a wide range of applications—from analyzing the shape of micro-scale regions to measuring their physical properties.

Features

  • Automatic Observation
    Automatic Observation
    Adjusts Laser Beam, Adjusts Parameter Settings During Observation, and Performs Image Processing Automatically
  • Saves Time
    Saves Time
    Various Support Functionality Achieves Fast Observation
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Videos

  • SPM-Nanoa Scanning Probe Microscope/Atomic Force Microsope

    • Surface Analysis

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