AIM-9000 FTIR Microscope

Automated AIM-9000 Infrared Microscope Allows Performing All Steps in Micro Analysis Quickly and Easily
 
AIM-9000 FTIR Microscope

With automated analysis functions and an enhanced wide field camera option, the AIM-9000 FTIR microscope enables analysts of all experience levels to observe, measure, and analyze micro samples quickly and efficiently. Laboratories can use this infrared microscopy system to perform high-sensitivity analysis in fields such as electrical/electronics, forensics, pharmaceuticals, automotive, foods, and environmental (microplastics).

Key Features/Benefits

Fast, Easy Positioning

With a 330X digital zoom “view to scan” feature, the AIM-9000 infrared microscope provides analysts with an easier and more efficient sample positioning tool for accurate analysis. In addition to observing large areas up to 10x13 mm, analysts can use the wide field camera (optional) and microscope camera together to zoom and position areas as small as 30x40 μm without loss or repositioning of the sample.

 
 

Automatic Contaminant Recognition

Software for the AIM-9000 FTIR microscope includes a function that automatically recognizes contaminants. Analysts simply click one button and the software automatically selects potential areas for analysis and suggests optimal aperture sizes and angles, all in only one second.

Two modes are available: the standard mode and one optimized for extremely small areas.

Standard Function

Standard

Micro Function

Micro

 

Automatic Identification of Contaminants

A proprietary contaminant analysis program for this infrared microscope analyzes contaminants using both library scans and key spectral features to rapidly match spectra and provide identification with reporting for accurate search results.

Program features:

  • Spectra for more than 550 inorganic substances, organic substances, and polymers commonly detected in contaminant analysis.
  • Automated searching for spectra, determination of matches, and preparation of reports.
  • Even for contaminants that are mixtures, it searches for primary and secondary components and displays the probability of candidate substances.
 

A unique library for analyzing contaminants in tap water and food products as well as a thermal-damaged plastics library are also available as options for this FTIR microscope.

 
 

Ultra Micro Analysis

With a 30,000:1 signal-to-noise ratio, the AIM-9000 FTIR microscope yields low noise spectra from even extremely small contaminants for better library matching results.

Shown here is a transmission measurement of polystyrene beads. Low noise and a high-quality spectrum of a very small sample were obtained with only a small number of scans.

Transmission measurement of polystyrene beads

 
 

Visible/Infrared Dual View System

Allows measuring infrared spectra while checking a visible image of the sample. When used in combination with the tiling function, the AIM-9000 FTIR microscope can perform visible observations and infrared measurements anywhere within the stage operating range, eliminating the need to reposition the sample.

 
 

Chemical Imaging

The invisible distribution of chemicals can be visualized based on peak height or area, multivariate analysis (PCR/MCR), or spectral similarity to target spectra when using the AIM-9000 FTIR microscope with an optional mapping program.

The following shows the chemical image of pharmaceutical powder.

Chemical image of pharmaceutical powder

 
 

High-Sensitivity ATR Measurement

A steep incident angle for the infrared light allows the AIM-9000 infrared microscope to acquire excellent distortion-free ATR spectra even when measuring samples with a high refractive index.

Applications

The AIM-9000 FTIR microscope can be used for applications in a variety of fields. Below is a list of some examples:

  • Analysis of contaminants and foreign substances adhering to foods, pharmaceuticals, and automotive materials
  • Simultaneous measurement and visual observation of multilayer films
  • Qualitative and mapping analysis of microplastics
  • Reflectance measurements of thick samples (larger than 10 mm)
  • Defect analysis of electronics and electrical parts, such as circuit boards
 

Check out these featured infrared microscopy applications:

For Research Use Only. Not for use in diagnostic procedures.

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