SPM-Nanoa Scanning Probe / Atomic Force Microscope

Wide Assortment of Expansion Functionality

Functionality and Expandability for Satisfying a Wide Variety of Requirements

■ Indicates standard specifications
□ Indicates optional specifications

Other specifications are also available by special order. For more information, contact a Shimadzu representative.

Contact Mode
■Contact Mode

Dynamic Mode
■Dynamic Mode

Phase Mode
■Phase Mode

Lateral Force Mode (LFM)
■Lateral Force Mode (LFM)

 

Force Modulation Mode
■Force Modulation Mode

Current / I-V Mode
□Current / I-V Mode

Surface Potential Mode (KFM)
□Surface Potential Mode (KPFM)

Lateral Force Mode (MFM)
□Magnetic Force Mode (MFM)

 

Force Curve
■Force Curve
□Nano 3D Mapping Fast

Piezoelectric Force Mode (PFM)
□Piezoelectric Force
Mode (PFM)

STM
□STM

Vector Scanning
□Vector Scanning

 

Observation in Liquid
□Observation in Liquid

Optional

 

■ Indicates standard specifications
□ Indicates optional specifications

Other specifications are also available by special order. For more information, contact a Shimadzu representative.

HT Scanner
■HT Scanner
(10 μm x 10 μm x 1 μm)

Medium-Range Scanner
□Medium-Range Scanner
(30 μm x 30 μm x 5 μm)

Large-Range Scanner
□Large-Range Scanner
(125 μm x 125 μm x 7 μm)

Deep-Type Scanner
□Deep-Type Scanner
(55 μm x 55 μm x 13 μm)

 

Small-Range Scanner
□Small-Range Scanner
(2.5μm x 2.5μm x 0.5μm)

Fiber Light
□Fiber Light

Cross-Sectional View Sample Holder
□Cross-Sectional View
Sample Holder

Particle Analysis Software
□Particle Analysis Software

 

Active Vibration Damper
□Active Vibration Damper

Stand
□Active Vibration Damper with a Stand

Cantilever Mounting Jig
□Cantilever Mounting Jig

Static Eliminator
□Static Eliminator

 

Computer Table
□Computer Table

 
 
 

Shape

Contact Mode

Contact Mode

Surface shape is observed by scanning with the amount of cantilever bending kept constant.

Dynamic Mode

Dynamic Mode

Surface shape is observed by scanning with the amplitude of cantilever oscillation kept constant.

 

Physical Properties

Phase Mode

Phase Mode

This mode observes the surface viscoelasticity distribution by detecting the phase shift delay in cantilever oscillation.

Lateral Force Mode (LFM)

Lateral Force Mode (LFM)

This mode observes the horizontal forces (friction forces) by detecting cantilever torsion.

Force Modulation Mode

Force Modulation Mode

This mode observes the distribution of viscosity and elasticity by separating the cantilever response into amplitude and phase components.

Nano 3D MappingTM Fast (Optional)

Nano 3D MappingTM Fast (Optional)

This calculates the elastic modulus, adsorption forces, or other properties of sample surfaces based on force curve measurements and then observe the distribution of those values.

 

Electromagnetivity (Optional)

Current Mode

Current Mode

Electrical properties of surfaces are observed by detecting the current flowing through the cantilever.

Surface Potential Mode (KPFM)

Surface Potential Mode (KPFM)

Surface electric potential is observed by detecting the static electric force acting on the cantilever.

Magnetic Force Mode (MFM)

Magnetic Force Mode (MFM)

Surface magnetic domain distribution is observed by detecting the magnetic force acting on the cantilever.

Piezoelectric Force Mode (PFM)

Piezoelectric Force Mode (PFM)

Surface polarity distribution is observed by detecting the piezoelectric response to electrical signals.

STM

STM

Surface shape is observed by scanning the metal probe with the tunneling current kept constant.

 

Machining (Optional)

Vector Scanning

Vector Scanning

In this mode, surfaces can be scanned based on user-specified scan settings, such as direction, speed, load, and applied voltage.

 

Atmospheric Control (Optional)

Observation in Liquid

Observation in Liquid

Contact, dynamic, and phase modes can be used in a liquid atmosphere.

For Research Use Only. Not for use in diagnostic procedures.

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