How To Change Lamps in a Shimadzu UV-VIS Instrument
This video demonstrates how to change the lamps in a Shimadzu UV-VIS Spectrophotometer.
SolidSpec-3700i/3700iDUV Spectrophotometer
UV-VIS-NIR Spectrophotometers
Top-of-the-line UV-Vis systems offering high sensitivity, deep UV measurement and very large sample compartments
The SolidSpec-3700i (DUV) UV-Vis spectrophotometers facilitate measurement of large samples and respond to industrial need of automation with the X-Y stage.
Shimadzu’s SolidSpec-3700i and SolidSpec-3700i DUV (Deep-UV) spectrophotometers can measure from deep-UV to 2600nm in the NIR region with the standard 60 mm integrating sphere detector. Horizontal placement of large samples enhances measurement stability. Various accessories expand their capabilities to carry out advanced tasks. A DDU (Direct Detection Unit) can be installed to extend the spectral range to 3300 nm and increase spectral resolution. A variable angle measurement unit measures absolute reflectance of samples with incident angle from 5 – 70 degrees. With the automatic X-Y stage, designated multiple locations on a large sample (maximum sample size: 310 mm×310 mm) can be measured.
Shimadzu’s LabSolutions UV-Vis software is included with the instrument. With the proper software compliance package, the SolidSpec-3700i and SolidSpec-3700i DUV UV-Vis-NIR spectrophotometers can provide total data integrity, user administration and audit trails to fully comply with FDA 21 CFR Part 11 compliance.
Key Features
- A double-beam, double monochromator system to make measurements with low stray light, high accuracy and high repeatability
- Wide spectral range for characterization of a variety of materials
- Absolute or variable-angle specular reflectance measured with the aid of dedicated accessories
- Supports automated measurement with the X-Y stage
- Spectrum, quantitation, photometric, and time course measurement modes available in the LabSolutions UV-Vis software
- Full Support for FDA 21 CFR Part 11 and Other Regulations
Quick Specs
| Wavelength Range | 240-2600 nm (DUV Model: 175-2600 nm) |
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| Detector | PMT, InGaAs Photodiode, Cooled PbS Photomultiplier |
| Maximum Abs | 6 Abs |
| Scan Speed | UV-Vis: 4500 nm/min NIR (PMT/InGaAs): Max 9000 nm/min NIR (PbS): 4000 nm/min |
| Compatible Accessories | Large specular reflectance attachment, variable angle measurement unit, fixed angle absolute reflectance accessories, automatic X-Y stage, direct detecting unit (DDU) |
| Sample Compartment | Internal Dimensions: W 900 x D 700 x H 350 mm Maximum dimensions of measurable sample: W 700 x D 560 x T 40 mm |
High Sensitivity
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Three detectors attached to a 60mm integrating sphere
The SolidSpec-3700i (DUV) is a double-beam, double-monochromator spectrophotometer that ensures signal stability and minimizes stray light. The SolidSpec-3700i (DUV) has three detectors attached to a 60 mm integrating sphere. The sensitivity in the near-infrared region is significantly enhanced by using both InGaAs and cooled PbS detectors. Highly accurate and highly sensitive spectra are obtainable from ultraviolet to near-infrared for transmittance and reflectance measurement of samples.
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Wide Measurement Wavelength Range
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Wavelength range of 165 nm to 3300 nm with optional Direct Detection Unit (DUV)
The three detectors on a SolidSpec-3700i cover a wide measurement wavelength range. In addition, the SolidSpec-3700i DUV model enables measurement in the range of 175 nm to 2600 nm with an integrating sphere and the range of 165 nm to 3300 nm with the optional Direct Detection Unit (DUV).
Materials which do not absorb deep ultraviolet light are used on the SolidSpec-3700i DUV. For example, the PMT detector uses fused silica as window material and the integrating sphere is coated with resin that is highly reflective in the deep ultraviolet region. Nitrogen gas purging for both the optical and the sample compartment is required to remove the oxygen absorption peak below 190 nm. Effective purging design reduces the purging time required after sample replacement, and high sensitivity with lower stray light in the deep UV region is achieved.
Large Sample Compartment Accommodates a Wide Variety of Samples
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700W × 560D × 40H mm maximum sample size
The SolidSpec-3700i & 3700i DUV features a large sample compartment whose internal dimensions are 900W × 700D × 350H mm. Three-dimensional optical path allows a sample maximum of 700W × 560D × 40H mm to be set horizontally in the sample compartment. A wide variety of accessories, such as absolute specular reflectance attachments, 5-degree large specular reflectance attachment, variable angle measurement unit and DDU expand the application range. Automatic measurements can be performed using the optional Automatic X-Y Stage by inputting the coordinates of measurement positions. An entire sample area of 12 inches or 310 × 310 mm is measurable.
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Videos
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How To Measure Absolute Reflectance with the Variable Angle Specular Reflectance Attachment
The variable angle specular reflectance, or VASR, attachment is available on several Shimadzu UV-Vis spectrophotometers – UV-2600i, UV-3600i Plus and the SolidSpec-3700i. The spectral ranges of VASR attachments vary with each model. For example, the one on the SolidSpec-3700i can measure from 250 nm up to 2500 nm when the angle of incidence is less than 12 degrees. The angle of incidence may vary from 5 to 70 degrees. A VASR attachment is good for measuring both transmittance and reflectance at variable incidence angles. In this demo, I will measure the absolute reflectance of a mirror.
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How To Measure Transmittance/Reflectance Using the XY Stage in Shimadzu’s SolidSpec-3700i
This video shows operation of the X-Y stage on Shimadzu’s SolidSpec-3700i spectrophotometer for automatic transmittance or reflectance measurements. Once a file that designates measurement mode, coordinated axis and measurement positions are prepared transmittance/ reflectance measurement can be automatically carried out according to the settings. The SolidSpec-3700iPlus covers a wide spectral range from the deep UV to NIR, it’s a powerful tool for spectral characterization of large samples.
News / Events
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SCIX 2025 - The Great SCIentific eXchange (formerly FACSS)
October 6-8
Northern Kentucky Convention Center
Covington, KY
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Shimadzu Scientific Instruments Introduces Three UV-Vis Spectrophotometers
Shimadzu releases the UV-1900i Plus, UV-2600i Plus, and UV-2700i Plus
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Shimadzu’s New IRSpirit-X Series of Compact FTIR Spectrophotometers Provide High Performance and Sensitivity in a Space-Saving Design
IRSpirit-X is the smallest and lightest FTIR instrument from Shimadzu with a space-saving design that does not compromise on performance or expandability.
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New AIMsight Infrared Microscope Maximizes Automation to Improve Microsample Analysis
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New One-Of-A-Kind AIRsight™ Infrared/Raman Microscope Enables Acquisition of Complementary Molecular Information
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New IRXross™ FTIR Spectrophotometer Delivers High-End Sensitivity, Enhanced Resolution and High-Quality Data
Shimadzu Scientific Instruments introduces the IRXross™ Fourier Transform Infrared (FTIR) Spectrophotometer. This mid-level FTIR model achieves upper-end performance including high-level S/N ratio, resolution, measurement speed and ease of use.
Sustainability initiatives
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7 Affordable and clean energy
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12 Responsible consumption and production